Basu, J and Divakar, R and Ravishankar, N and Carter, CB (2008) Complementary Microscopy Techniques for Characterizing Nanostructures. In: Microscopy and Microanalysis, 14 (52). pp. 374-375.
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Official URL: http://journals.cambridge.org/action/displayAbstra...
| Item Type: | Journal Article |
|---|---|
| Additional Information: | Copyright of this article belongs to Cambridge University Press. |
| Department/Centre: | Others |
| Date Deposited: | 11 Aug 2011 11:28 |
| Last Modified: | 11 Aug 2011 11:28 |
| URI: | http://eprints.iisc.ernet.in/id/eprint/39887 |
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