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Microstructural Studies of Ferroelectric Bi2VO5.5 Thin Films With LaNiO3 Electrodes

Beesabathina, Prasad D and Riba, Salmanca L and Hegde, MS and Satyalakshmi, KM and Prasad, KVR and Varma, KBR (1994) Microstructural Studies of Ferroelectric Bi2VO5.5 Thin Films With LaNiO3 Electrodes. In: MRS Proceedings, 341 .

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Official URL: http://journals.cambridge.org/action/displayAbstra...

Abstract

Thin films of Bi2VO5.5 (BVO), a vanadium analog of the n = I member of the Aurivillius family, have been prepared by pulsed laser deposition. The BVO films grow along the [001] direction on LaNiO3(LNO) and YBa2Cu3O7 (YBCO) electrode buffer layers on LaA- IO3(LAO) substrates as obtained from X-ray diffraction studies. The microstructure of the films and of the interfaces within the film and between the film and the substrate were characterized using transmission electron microscopy. The in-plane epitaxial relationship of the rhombohedral LNO on perovskite LAO was [100] LNO // [100] LAO and [001] LNO // [001] LAO. High resolution lattice images showed a sharp interface between LNO and LAO. However, the LNO film is twinned with a preferred orientation along the growth direction. The BVO layer is single crystalline on both LNO/LAO and YBCO/LAO with the caxis parallel to the growth direction except for a thin layer of about 400 Å at the interface which is polycrystalline.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Cambridge University Press.
Department/Centre: Others
Date Deposited: 17 Aug 2011 07:04
Last Modified: 17 Aug 2011 07:04
URI: http://eprints.iisc.ernet.in/id/eprint/39930

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