Chakraborty, N and Mahapatra, DR and Sen, S (2008) Role of residual stress and micro-cracks on the electrical resistivity of Si/SiO2/TiO2/Pt/PZTx-PMN(1-x) Multilayer Thin Film. In: EMIT08 Int. Conf. Emerging Microelectronics and Interconnection Technologies.
Full text not available from this repository.| Item Type: | Conference Paper |
|---|---|
| Department/Centre: | Division of Mechanical Sciences > Aerospace Engineering (Formerly, Aeronautical Engineering) |
| Date Deposited: | 27 Sep 2011 09:11 |
| Last Modified: | 27 Sep 2011 09:11 |
| URI: | http://eprints.iisc.ernet.in/id/eprint/40928 |
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