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Capture Power Reduction for Modular System-on-Chip Test

Tudu, Jaynarayan and Larsson, Erik and Singh, Virendra and Singh, Adit (2009) Capture Power Reduction for Modular System-on-Chip Test. In: 14th IEEE VLSI Design and Test Symposium (VDAT), Bangalore.

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Item Type: Conference Paper
Department/Centre: Division of Information Sciences > Supercomputer Education & Research Centre
Date Deposited: 14 Dec 2011 05:24
Last Modified: 14 Dec 2011 05:24
URI: http://eprints.iisc.ernet.in/id/eprint/41258

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