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Optical properties of Bi2VO5.5 thin films on platinized silicon measured by spectroscopic ellipsometry

Neelam, K and Krupanidhi, SB and Varma, KBR (2007) Optical properties of Bi2VO5.5 thin films on platinized silicon measured by spectroscopic ellipsometry. In: IUMRS-ICAM 2007 , 8-13, October 2007 .

Full text not available from this repository.
Item Type: Conference Paper
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 11 Oct 2011 06:08
Last Modified: 11 Oct 2011 06:08
URI: http://eprints.iisc.ernet.in/id/eprint/41334

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