Banerjee, Gaurab and Behera, Manas and Zeidan, Mohamad A and Chen, Rick and Barnett, Kenneth (2011) Analog/RF Built-in-Self-Test Subsystem for a Mobile Broadcast Video Receiver in 65-nm CMOS. In: IEEE Journal of Solid-State Circuits, 46 (9). pp. 1998-2008.
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A built-in-self-test (BIST) subsystem embedded in a 65-nm mobile broadcast video receiver is described. The subsystem is designed to perform analog and RF measurements at multiple internal nodes of the receiver. It uses a distributed network of CMOS sensors and a low bandwidth, 12-bit A/D converter to perform the measurements with a serial bus interface enabling a digital transfer of measured data to automatic test equipment (ATE). A perturbation/correlation based BIST method is described, which makes pass/fail determination on parts, resulting in significant test time and cost reduction.
|Item Type:||Journal Article|
|Additional Information:||Copyright 2011 IEEE. Personal use of this material is permitted.However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Keywords:||Analog;BIST;built in self-test;CMOS; perturbation/correlation;RF;test cost;test time|
|Department/Centre:||Division of Electrical Sciences > Electrical Communication Engineering|
|Date Deposited:||25 Oct 2011 09:48|
|Last Modified:||04 Jan 2013 11:11|
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