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Reliability and Interval Estimation of Type-II Censored Electrical Insulation Data

Shetty, Pradeep Kumar and Ramu, TS (2004) Reliability and Interval Estimation of Type-II Censored Electrical Insulation Data. In: Conference Record of the 2004 IEEE International Symposium on Electrical Insulation, 19-22 September, Indianapolis,USA, pp. 402-405.

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Abstract

The paper presents some analytical results pertaining to the estimation of variance of the parameters of a three parameter Weibull distribution (3pW) under type-II censoring. Ageing failure data acquired on an insulating material of considerable application potential has been used to demonstrate the results. The point estimates of the parameters of failure time distribution are obtained using maximum likelihood estimation method. The true value of the variance of the ML estimates for 3pW are hard to obtain and the situation becomes more complex when the data is censored. The asymptotic variance can be obtained by taking the inverse of the Fisher information matrix, the computation of which is quite involved in the case of censored 3-pW data. Approximations are reported in the literature to simplify the procedure. The authors have considered the effects of such approximations on the precision of variance estimates when the sample size is greatly limited by practical difficulties in obtaining the authentic data. A detailed study of the effect of censoring on the ML estimates, under this condition is also presented.

Item Type: Conference Paper
Additional Information: �©1990 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre: Division of Electrical Sciences > High Voltage Engineering (merged with EE)
Date Deposited: 07 Dec 2005
Last Modified: 19 Sep 2010 04:21
URI: http://eprints.iisc.ernet.in/id/eprint/4330

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