Krupanidhi, SB and Rajareddy, M and Victor, P and Laha, Apurba and Venkateswarlu, P (2003) Effect of AC&DC field on the dielectric response of (Pb,La)TiO3 thin films. In: 15th International Symposium on Integrated Ferroelectrics, MAR 09-12, 2003, Colorado Springs, Colorado.
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Lanthanum doped lead titanate thin films are the potential candidates for the capacitors, actuators and pyroelectric sensor applications due to their excellent dielectric, and ferroelectric properties. Lanthanum doped lead titanate thin films are grown on platinum coated Si substrates by excimer laser ablation technique. A broad diffused phase transition with the maximum dielectric permittivity (ϵmax) shifting to higher temperatures with the increase of frequency, along with frequency dispersion below Tc, which are the signatures of the relaxor like characteristics were observed. The dielectric properties are investigated from −60°C to 200°C with an application of different dc fields. With increasing dc field, the dielectric constant is observed to reduce and phase transition temperature shifted to higher temperature. With the increased ac signal amplitude of the applied frequency, the magnitude of the dielectric constant is increasing and the frequency dispersion is observed in ferroelectric phase, whereas in paraelectric phase, there is no dispersion has been observed. The results are correlated with the existing theories.
|Item Type:||Conference Paper|
|Additional Information:||Copyright of this article belongs to Taylor and Francis Group.|
|Keywords:||PLT thin films;laser ablation;relaxor;Vogel-Fulcher relation;phase transition temperature|
|Department/Centre:||Division of Chemical Sciences > Materials Research Centre|
|Date Deposited:||12 Apr 2012 08:10|
|Last Modified:||12 Apr 2012 08:10|
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