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Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg(1/3)Nb(2/3)O3-0.15PbTiO(3) Thin Films by Scanning Force Microscopy

Saranya, D. and John, Neena S. and Parui, Jayanta and Krupanidhi, SB (2012) Studies on Field Dependent Domain Structures in Multi-Grained 0.85PbMg(1/3)Nb(2/3)O3-0.15PbTiO(3) Thin Films by Scanning Force Microscopy. In: Integrated Ferroelectrics: An International Journal, 134 (1). pp. 39-47.

Full text not available from this repository.
Official URL: http://dx.doi.org/10.1080/10584587.2012.663681

Abstract

0.85PbMg(1/3)Nb(2/3)O(3)-0.15PbTiO(3) (0.85PMN-0.15PT) ferroelectric relaxor thin films have been deposited on La0.5Sr0.5CoO3/(111) Pt/TiO2/SiO2/Si by pulsed laser ablation by varying the oxygen partial pressures from 50 mTorr to 400 mTorr. The X-ray diffraction pattern reveals a pyrochlore free polycrystalline film. The grain morphology of the deposited films was studied using scanning electron microscopy and was found to be affected by oxygen pressure. By employing dynamic contact-electrostatic force microscopy we found that the distribution of polar nanoregions is majorly affected by oxygen pressure. Finally, the electric field induced switching in these films is discussed in terms of domain wall pinning.

Item Type: Journal Article
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 05 Jun 2012 12:38
Last Modified: 05 Jun 2012 12:38
URI: http://eprints.iisc.ernet.in/id/eprint/44638

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