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Self Repair in Circuits-Automating Open Fault Repair in Integrated Circuits Using Field-Induced Aggregation of Carbon Nanotubes

Sambandan, Sanjiv (2012) Self Repair in Circuits-Automating Open Fault Repair in Integrated Circuits Using Field-Induced Aggregation of Carbon Nanotubes. In: IEEE TRANSACTIONS ON ELECTRON DEVICES, 59 (6). pp. 1773-1779.

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Official URL: http://dx.doi.org/10.1109/TED.2012.2191557

Abstract

This paper presents studies on the use of carbon nanotubes dispersed in an insulating fluid to serve as an automaton for healing open-circuit interconnect faults in integrated circuits. The physics behind the repair mechanism is the electric-field-induced diffusion limited aggregation. On the occurrence of an open fault, the repair is automatically triggered due to the presence of an electric field across the gap. We perform studies on the repair time as a function of the electric field and dispersion concentrations with the above application in mind.

Item Type: Journal Article
Additional Information: Copyright for this article belongs to the IEEE
Keywords: Automation;carbon nanotubes (CNTs);integrated circuit; reliability; repair
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 14 Jul 2012 06:59
Last Modified: 14 Jul 2012 06:59
URI: http://eprints.iisc.ernet.in/id/eprint/44683

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