Vishwakarma, PN and Prasad, V and Subramanyam, SV and Ganesan, V (2005) Structural morphology of amorphous conducting carbon film. In: Bulletin of Materials Science, 28 (6). pp. 609-615.
Amorphous conducting carbon films deposited over quartz substrates were analysed using X-ray diffraction and AFM technique. X-ray diffraction data reveal disorder and roughness in the plane of graphene sheet as compared to that of graphite. This roughness increases with decrease in preparation temperature. The AFM data shows surface roughness of carbon films depending on preparation temperatures. The surface roughness increases with decrease in preparation temperature. Also some nucleating islands were seen on the samples prepared at 900 degrees C,which are not present on the films prepared at 700 degrees C. Detailed analysis of these islands reveals distorted graphitic lattice arrangement. So we believe these islands to be nucleating graphitic.Power spectrum density (PSD) analysis of the carbon surface indicates a transition from the nonlinear growth mode to linear surface-diffusion dominated growth mode resulting in a relatively smoother surface as one moves from low preparation temperature to high preparation temperature.The amorphous carbon films deposited over a rough quartz substrate reveal nucleating diamond like structures. The density of these nucleating diamond like structures was found to be independent of substrate temperature (700-900 degrees C).
|Item Type:||Journal Article|
|Additional Information:||Copyright for this article belongs to Indian Academy of Sciences.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Date Deposited:||13 Dec 2005|
|Last Modified:||19 Sep 2010 04:22|
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