Naik, Ramakanta and Kumar, C and Ganesan, R and Sangunni, KS (2012) Effect of Thickness on The Optical Properties Change in Bi/As2S3 Bilayer Thin Films. In: 56th DAE-Solid State Physics Symposium (SSPS), DEC 19-23, 2011 , SRM Univ, Kattankulathur, INDIA, pp. 623-624.Full text not available from this repository.
Bilayer thin films of Bi/As2S3 were prepared from Bi and As2S3 by thermal evaporation technique under high vacuum. We have prepared three bilayer films of 905nm, 910nm and 915nm thickness with with As2S3 as bottom layer (900nm) and Bi as top layer (5,10,15 nm). We have compared the optical changes due to the thickness variation of Bi layer on As2S3 film. The changes were characterized by FTIR and XPS techniques.
|Item Type:||Conference Proceedings|
|Additional Information:||Copyright for this article belongs to AMER INST PHYSICS, USA|
|Keywords:||Thin films;Optical properties;XPS|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Depositing User:||Francis Jayakanth|
|Date Deposited:||04 Dec 2012 15:10|
|Last Modified:||04 Dec 2012 15:10|
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