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High Temperature XRD of Cu2.1Zn0.9SnSe4

Chetty, Raju and Mallik, Ramesh Chandra (2014) High Temperature XRD of Cu2.1Zn0.9SnSe4. In: 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B, DEC 17-21, 2013, Thapar Univ, Patiala, INDIA, pp. 1711-1713.

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Official URL: http://dx.doi.org/10.1063/1.4873086

Abstract

Quaternary compound with chemical composition Cu2.1ZnSnSe4 is prepared by solid state synthesis. High temperature XRD (X-Ray Diffraction) of this compound is used in studying the effect of temperature on lattice parameters and thermal expansion coefficients. Thermal expansion coefficient is one of the important quantities in evaluating the Gruneisen parameter which further useful in determining the lattice thermal conductivity of the material. The high temperature XRD of the material revealed that the lattice parameters as well as thermal expansion coefficients of the material increased with increase in temperature which confirms the presence of anharmonicty.

Item Type: Conference Proceedings
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Additional Information: Copy right for this article belongs to the AMER INST PHYSICS, 2 HUNTINGTON QUADRANGLE, STE 1NO1, MELVILLE, NY 11747-4501 USA.
Keywords: High-temperature techniques and instrumentation; X-ray diffraction; Thermal expansion
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 08 Nov 2014 05:23
Last Modified: 08 Nov 2014 05:23
URI: http://eprints.iisc.ernet.in/id/eprint/50189

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