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Adaptive Mesh Refinement for Fast Convergence of EFIE-Based 3-D Extraction

Das, Arkaprovo and Gope, Dipanjan (2015) Adaptive Mesh Refinement for Fast Convergence of EFIE-Based 3-D Extraction. In: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY , March 2015, pp. 404-414.

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Official URL: http://dx.doi.org/10.1109/TCPMT.2015.2393895

Abstract

3-D full-wave method of moments (MoM) based electromagnetic analysis is a popular means toward accurate solution of Maxwell's equations. The time and memory bottlenecks associated with such a solution have been addressed over the last two decades by linear complexity fast solver algorithms. However, the accurate solution of 3-D full-wave MoM on an arbitrary mesh of a package-board structure does not guarantee accuracy, since the discretization may not be fine enough to capture spatial changes in the solution variable. At the same time, uniform over-meshing on the entire structure generates a large number of solution variables and therefore requires an unnecessarily large matrix solution. In this paper, different refinement criteria are studied in an adaptive mesh refinement platform. Consequently, the most suitable conductor mesh refinement criterion for MoM-based electromagnetic package-board extraction is identified and the advantages of this adaptive strategy are demonstrated from both accuracy and speed perspectives. The results are also compared with those of the recently reported integral equation-based h-refinement strategy. Finally, a new methodology to expedite each adaptive refinement pass is proposed.

Item Type: Conference Proceedings
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Additional Information: Copy right for this article belongs to the IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
Keywords: Adpative mesh refinement; electric field integral equation (EFIE); method of moments (MoM)
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited: 24 Apr 2015 05:51
Last Modified: 24 Apr 2015 05:51
URI: http://eprints.iisc.ernet.in/id/eprint/51380

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