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Dynamics of Plasmon in Graphene Oxide

Javvaji, Brahmanandam and Mahapatra, Roy D and Raha, S (2015) Dynamics of Plasmon in Graphene Oxide. In: Conference on Nanosensors, Biosensors, and Info-Tech Sensors and Systems, MAR 09-11, 2015, San Diego, CA.

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Official URL: http://dx.doi.org/ 10.1117/12.2085720

Abstract

Dynamic effects of plasmon such as scattering with defect boundaries and oxygen impurities in the graphene oxide are investigated. Study of plasmon dynamics helps in understanding electronic, opto-electronic and biological applications of graphene based nanostructures. Tuning or control over such applications is made possible by graphene nanostructure engineering. We have modeled defects with increased smoothing of defect edge in graphene keeping area of the defect constant. Scattering of plasmons in graphene with defects is modeled using an electromagnetic field coupled inter-atomic potential approach with finite element discretization of the atomic vibrational and electromagnetic field degrees of freedom. Our calculations show pi + sigma plasmon red shifting under sharp defect edges whereas pi plasmon show high extinction efficiency. Strong localization of electric fields near the sharp defect edges is observed. Observations on plasmons and its dynamics draws attention in designing novel optoelectronic devices and binders for bio-molecules.

Item Type: Conference Proceedings
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Additional Information: Copy right for this article belongs to the SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
Keywords: Plasmons; scattering; electromagnetic fields; graphene; graphene oxide; defects
Department/Centre: Division of Information Sciences > Supercomputer Education & Research Centre
Division of Mechanical Sciences > Aerospace Engineering (Formerly, Aeronautical Engineering)
Date Deposited: 19 Jul 2015 09:42
Last Modified: 23 Jul 2015 09:41
URI: http://eprints.iisc.ernet.in/id/eprint/51897

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