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Lattice orientation and crack size effect on the mechanical properties of Graphene

Budarapu, P R and Javvaji, B and Sutrakar, V K and Mahapatra, Roy D and Paggi, M and Zi, G and Rabczuk, T (2017) Lattice orientation and crack size effect on the mechanical properties of Graphene. In: INTERNATIONAL JOURNAL OF FRACTURE, 203 (1-2, S). pp. 81-98.

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Official URL: http://dx.doi.org/10.1007/s10704-016-0115-9

Abstract

The effect of lattice orientation and crack length on the mechanical properties of Graphene are studied based on molecular dynamics simulations. Bond breaking and crack initiation in an initial edge crack model with 13 different crack lengths, in 10 different lattice orientations of Graphene are examined. In all the lattice orientations, three recurrent fracture patterns are reported. The influence of the lattice orientation and crack length on yield stress and yield strain of Graphene is also investigated. The arm-chair fracture pattern is observed to possess the lowest yield properties. A sudden decrease in yield stress and yield strain can be noticed for crack sizes < 10 nm. However, for larger crack sizes, a linear decrease in yield stress is observed, whereas a constant yield strain of 0.05 is noticed. Therefore, the yield strain of 0.05 can be considered as a critical strain value below which Graphene does not show failure. This information can be utilized as a lower bound for the design of nano-devices for various strain sensor applications. Furthermore, the yield data will be useful while developing the Graphene coating on Silicon surface in order to enhance the mechanical and electrical characteristics of solar cells and to arrest the growth of micro-cracks in Silicon cells.

Item Type: Journal Article
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Additional Information: Copy right for this article belongs to the SPRINGER, VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS
Department/Centre: Division of Mechanical Sciences > Aerospace Engineering (Formerly, Aeronautical Engineering)
Date Deposited: 08 Mar 2017 09:54
Last Modified: 08 Mar 2017 09:54
URI: http://eprints.iisc.ernet.in/id/eprint/56300

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