Ramachandra, B and Nema, RS (1996) Characterisation of Partial Discharge Pulses in Artificial Voids in Polypropylene Films Used in Capacitors. In: Conference Record of the 1996 IEEE International Symposium on Electrical Insulation, 16-19 June, Montreal,Quebec,Canada, Vol.2, 517 -520.
Partial discharges in voids may cause deterioration of solid insulating materials. They often start in voids enclosed in insulation and or at the interface defects. A method of measuring fast discharge pulses with rise times below 1 ns is reported. Characterisation of partial discharge pulses in artificial voids in polypropylene films at atmospheric pressure is analysed that incorporates inception voltage, apparent and real charge, drift velocity and mobility of electrons.
|Item Type:||Conference Paper|
|Additional Information:||Copyright 1990 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Department/Centre:||Division of Electrical Sciences > High Voltage Engineering (merged with EE)|
|Date Deposited:||22 Aug 2008|
|Last Modified:||19 Sep 2010 04:26|
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