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A Simulation-Based Test Generation Scheme Using Genetic Algorithms

Srinivas, M and Patnaik, LM (1993) A Simulation-Based Test Generation Scheme Using Genetic Algorithms. In: Sixth International Conference on VLSI Design,1993., 3-6 January, Bombay,India, 132 -135.

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Abstract

This paper discusses a Genetic Algorithm-based method of generating test vectors for detecting faults in combinational circuits. The GA-based approach combines the merits of two techniques that have been used previously for generating test vectors - the directed search approach and the random test method. We employ a variant of the traditional GA, the Adaptive GA (AGA), to improve the effi cacy of the genetic search. Two cost functions that are used for assessing the quality of the vectors are discussed. The performance of the AGA-based test generation approach has been evaluated using ISCAS-85 benchmark circuits. In our approach, the number of vectors that need to be simulated for detecting all detectable faults is significantly smaller than that required for a random test method. Even when optimized input distributions are used to generate the random test vectors, the AGA sustains its superior performance over the random test method.

Item Type: Conference Paper
Additional Information: Copyright 1990 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre: Division of Electrical Sciences > Computer Science & Automation (Formerly, School of Automation)
Date Deposited: 22 Aug 2008
Last Modified: 19 Sep 2010 04:26
URI: http://eprints.iisc.ernet.in/id/eprint/6803

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