Vipin, PM and Kishore, NK and Nagabhushana, GR and Jayaram, BN (1990) Degradation Of Metal Oxide Surge Arresters Under Simulated Natural Conditions. In: ACE '90 (XVI Annual Convention and Exhibition of the IEEE In India), 22-25 January, Bangalore,India, pp. 165-169.
The degradation of metal oxide surge arresters (MOSA) under continous operating voltage (C. 0. V), with time, is a well-known fact. But the contribution of transient overvoltages in the form of lightning surges, switching surges etc. against which the arrester is used as a protection device, to the arrester degradation has not been studied much. The simulation of a situation, wherein the arrester is kept uder C.O.V and different surges are applied on it, is somewhat complex. A method for simulation of field operating conditions of an arrester in the laboratory is presented in this paper. Results of two separate degradation studies on different samples under A.C, and D.C excitations with superimposed transient stresses 9 are given. A comparison of observed data with calculated ones is also made.
|Item Type:||Conference Paper|
|Additional Information:||Copyright 1990 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Department/Centre:||Division of Electrical Sciences > High Voltage Engineering (merged with EE)|
|Date Deposited:||25 Aug 2008|
|Last Modified:||19 Sep 2010 04:27|
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