Taneja, M and Viswanadham, N (1994) Inspection Allocation in Manufacturing Systems: A Genetic Algorithm Approach. In: 1994 IEEE International Conference on Robotics and Automation, 8-13 May, San Diego,CA, vol.4 3537 -3542.
In this paper, we are concerned with the problem of location of inspection centers in a multistage manufacturing system. A Genetic algorithm based approach is developed to determine the location of inspection centers resulting in a minimum expected total cost.The total cost includes inspection, manufacturing and scrapping cost at each stage of the manufacturing process. A penalty cost is included in it to account for a defective item which is not detected by the inspection scheme. A set of test problems are solved using this algorithm.
|Item Type:||Conference Paper|
|Additional Information:||Copyright 1994 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Department/Centre:||Division of Electrical Sciences > Computer Science & Automation (Formerly, School of Automation)|
|Date Deposited:||25 Aug 2008|
|Last Modified:||19 Sep 2010 04:27|
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