Alternating current conduction behavior of excimer laser ablated $SrBi_2Nb_2O_9$ thin films

Bhattacharyya, S and Bharadwaja, SSN and Krupanidhi, SB (2000) Alternating current conduction behavior of excimer laser ablated $SrBi_2Nb_2O_9$ thin films. In: Journal of Applied Physics, 88 (7). pp. 4294-4302.

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Abstract

Bi-layered Aurivillius compounds prove to be efficient candidates of nonvolatile memories.$SrBi_2Nb_2O_9$ thin films were deposited by excimer laser ablation at low substrate temperature (400°C) followed by an ex situ annealing at 750 °C. The polarization hysteresis behavior was confirmed by variation of polarization with the external applied electric field and also verified with capacitance versus voltage characteristics. The measured values of spontaneous and remnant polarizations were, respectively, 9 and 6 $\mu$C/cm2 with a coercive field of 90 kV/cm. The measured dielectric constant and dissipation factors at 100 kHz were 220 and 0.02, respectively. The frequency analysis of dielectric and ac conduction properties showed a distribution of relaxation times due to the presence of multiple grain boundaries in the films. The values of activation energies from the dissipation factor and grain interior resistance were found to be 0.9 and 1.3 eV, respectively. The deviation in these values was attributed to the energetic conditions of the grain boundaries and bulk grains. The macroscopic relaxation phenomenon is controlled by the higher resistive component in a film, such as grain boundaries at lower temperatures, which was highlighted in the present article in close relation to interior grain relaxation and conduction properties.

Item Type: Journal Article Copyright of this article belongs to American Institute of Physics. Division of Chemical Sciences > Materials Research Centre 14 Sep 2006 19 Sep 2010 04:30 http://eprints.iisc.ernet.in/id/eprint/8158