Hegde, M and Prasad, D (1995) An experience in conformance testing of an X.25 implementation. In: IETE Technical Review, 12 (3). pp. 205-213.Full text not available from this repository. (Request a copy)
This report describes the conformance testing of the X.25 PLP software on an intelligent X.25 card (maepXLINK) developed in the MAEP project in Indian Telephone Industries (ITI). The test design makes use of UIO sequences to verify the state of the FSM. There is no concept of a `test sequence'; instead, transitions are explored in a random fashion, in an attempt to cover unexplored edges each time. We can cover the most probable transitions, or the most important transitions first. The larger the extent of transitions covered, the better is the fault coverage. The method also allows testing to be continued even after an error is detected, if the IUT can be reset either by a single transition or by a sequence of transitions. The method proposed here was used as a supplementary test method for a formal test based on the Chinese postman tour problem.
|Item Type:||Journal Article|
|Additional Information:||Copyright for this article belongs to Institute of Electronics and Telecommunication Engineers.|
|Department/Centre:||Division of Electrical Sciences > Electrical Communication Engineering|
|Date Deposited:||20 Nov 2006|
|Last Modified:||27 Aug 2008 12:22|
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