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A study of the behaviour of subinterface cracks in bimaterial plates

Venkatesha, KS and Ramamurthy, TS and Dattaguru, B (1998) A study of the behaviour of subinterface cracks in bimaterial plates. In: Engineering Fracture Mechanics, 59 (2). pp. 241-252.

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Abstract

In this paper, finite element analysis of a subinterface crack in a bimaterial plate is presented with a view to quantify the definitive trends as the subinterface crack approaches the interface. The material properties of the bimaterial plate were chosen such that the crack-tip contact zones are large for the corresponding case of a bare interface crack problem. Both mode I and mode II loadings were studied separately and strain energy release rate (SERR) components were calculated when the subinterface crack lies parallel and at a distance "s" from the interface for various virtual crack extension (\Delta\ a) values. The SERR components at the subinterface crack tip were evaluated using a special generalized modified crack closure integral (GMCCI) algorithm, developed in an earlier paper by the present authors. The SERR components were evaluated for severals values and the study has clearly brought out the behaviour of SERR components as the distance of the subinterface crack s decreases to zero from a value of the order of the crack length. By carrying out a systematic finite element study of the variation of SERR components with \Delta\ a/a for various s values, the bare interface crack behaviour with stress-free crack faces reported in the literature was reproduced as s —> 0 in the present problem. Numerical results are presented for a specially designed problem with large crack-tip contact zones.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier.
Keywords: Bimaterial interface;Subinterface cracks;SERR;Contact zone;Virtual crack extension;Finite element analysis
Department/Centre: Division of Mechanical Sciences > Aerospace Engineering (Formerly, Aeronautical Engineering)
Date Deposited: 18 Jan 2007
Last Modified: 19 Sep 2010 04:34
URI: http://eprints.iisc.ernet.in/id/eprint/9535

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