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A New ATPG Technique (ExpoTan) for Testing Analog Circuits

Varaprasad, BKSVL and Patnaik, LM and Jamadagni, HS and Agrawal, VK (2007) A New ATPG Technique (ExpoTan) for Testing Analog Circuits. In: IEEE Transactions on Computer- Aided Design of Integrated Circuits and Designs, 26 (1). pp. 189-196.

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Abstract

In analog testing, usage of a single sinusoid as a test signal when compared to multitone signal, and fault detection with digital counting technique, facilitate the test implementation with simple built-in self-test hardware and make testing more cost effective. In this paper, a novel test-set-selection technique known as ExpoTan for testing lineartime- invariant (LTI) circuits is presented. The authors formulate the test generation problem with $tan^{-1}( )$ and exponential functions for identification of a test signal with maximum fault coverage. For identification of a test signal the ExpoTan technique combines test generation and testset- compaction tasks in a single phase and generates an efficient compacted test set. The experimental results show that the testing of LTI circuits using ExpoTan technique for the benchmark circuits achieves the required fault coverage with shorter testing time and test generation time.

Item Type: Journal Article
Additional Information: Copyright 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: Analog built-in self-test (BIST);Automatic test-pattern generation (ATPG);Sinusoidal steady-state testing;Test-set compaction
Department/Centre: Division of Electrical Sciences > Electronic Systems Engineering (Formerly, (CEDT) Centre for Electronic Design & Technology)
Division of Electrical Sciences > Computer Science & Automation (Formerly, School of Automation)
Date Deposited: 25 Aug 2008
Last Modified: 19 Sep 2010 04:34
URI: http://eprints.iisc.ernet.in/id/eprint/9686

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