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Thickness Effect on the Physical Properties of Evaporated SnS Films

Devika, M and Reddy, Koteeswara N and Ramesh, K and Ganesan, R and Gunasekhar, KR and Gopal, ESR and Reddy, Ramakrishna KT (2007) Thickness Effect on the Physical Properties of Evaporated SnS Films. In: Journal of the Electrochemical Society, 154 (2). H67-H73.

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Abstract

SnS films with different thicknesses have been deposited on glass substrates at a constant substrate temperature of 300°C. The physical properties of the films were investigated using energy dispersive analysis of X-rays, X-ray diffraction, scanning electron microscopy, atomic force microscopy, van der Pauw method, and Fourier transform infrared spectroscopy measurements at room temperature. The deposited films exhibit only SnS phase with different orientations. We show that the electrical resistivity, activation energy, and optical bandgap of the films depend strongly on the preferred orientation of the SnS films. The electrical resistivity of films decreased with the increase of film thickness. The optical and electrical data of the SnS film are well interpreted with the composition, crystal, and surface structure data.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to the Electrochemical Society
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 13 Mar 2007
Last Modified: 19 Sep 2010 04:34
URI: http://eprints.iisc.ernet.in/id/eprint/9721

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