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Conference Paper

Tudu, JT and Larsson, E and Singh, V and Fujiwara, H (2009) Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. In: 10th IEEE Workshop on RTL and High Level Test (WRTLT), Nov 2009, Praha, Czech Republic .

This list was generated on Sun Sep 21 16:16:42 2014 IST.