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Bysakh, S and Mitsuishi, K and Song, M and Furuya, K and Chattopadhyay, K (2004) Transmission electron microscopy and high-resolution transmission electron microscopy study of nanostructure and metastable phase evolution in pulsed-laser-ablation-deposited Ti-Si thin film. In: Journal Of Materials Research, 19 (4). pp. 1118-1125.

This list was generated on Thu Jul 24 06:34:37 2014 IST.