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Nukala, Suguna Sree and Gorthi, Sai Siva and Lolla, Kameswara Rao (2006) Novel composite coded pattern for small angle measurement using imaging method -art.no.62891D. In: Conference on Novel Optical Systems Design and Optimization IX,, Aug 15-16, 2006, San Diego, CA, D2891.
Gorthi, Sai Siva and Lolla, Kameswara Rao (2005) Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry. In: Optical Measurement Systems for Industrial Inspection IV, Monday 13 June 2005, Bellingham, WA.
Gorthi, Sai Siva and Lolla, Kameswara Rao (2005) A new approach for simple and rapid shape measurement of objects with surface discontinuities. In: Conference on Optical Measurement Systems for Industrial Inspection IV, JUN 13-17, 2005, Munich.
