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Jaiswal, Piyush and Kunte, GV and Umarji, AM and Shivashankar, SA (2009) Ellipsometric study of Atomic Layer Deposited TiO2 thin films. In: International Conference on Transport and Optical Properties of Nanomaterials (ICTOPON 2009), JAN 05-08, 2009, Allahabad, INDIA, pp. 396-401.
Jaiswal, Piyush and Sathar, Abdul and Shariff, Arshiyan and Saif, Mohammed and Dhar, Sukanya and Shivashankar, SA (2011) Comparison of CVD and MOCVD-grown Al2O3 coatings in the performance of cemented carbide cutting tool inserts. In: MRS Proceedings, 1298 .