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Conference Paper

Majhi, Ananta K and James, Jacob and Patnaik, Lalit M and Agrawal, Vishwani D (1995) An Efficient Automatic Test Generation System for Path Delay Faults in Combinational Circuits. In: 8th International Conference on VLSI Design, 4-7 January 1995, New Delhi, India, pp. 161-165.

This list was generated on Wed Oct 23 09:10:37 2019 IST.