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Conference Proceedings

Kranthi, N K and Mishra, Abhishek and Meersha, Adil and Variar, Harsha B and Shrivastava, Mayank (2018) Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. In: 2018 IEEE International Reliability Physics Symposium (IRPS), 11-15 March 2018, Burlingame.

Sinha, Rajat and Kranthi, N K and Sambandan, Sanjiv and Shrivastava, Mayank (2017) On the ESD Behavior of Pentacene Channel Organic Thin Film Transistors. In: 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), SEP 10-14, 2017, Tucson, AZ.

This list was generated on Mon Feb 17 16:25:15 2020 IST.