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Journal Article

Somayaji, Jhnanesh and Kumar, Sampath B and Bhat, M S and Shrivastava, Mayank (2017) Performance and Reliability Codesign for Superjunction Drain Extended MOS Devices. In: IEEE TRANSACTIONS ON ELECTRON DEVICES, 64 (10). pp. 4175-4183.

This list was generated on Mon Sep 23 23:11:42 2019 IST.