ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Browse by Author

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 2.

Conference Paper

Ahlawat, Satyadev and Tudu, Jaynarayan and Matrosova, Anzhela and Singh, Virendra (2016) A High Performance Scan Flip-Flop Design for Serial and Mixed Mode Scan Test. In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), JUL 04-06, 2016, Catalunya, SPAIN, pp. 233-238.

Ahlawat, Satyadev and Tudu, Jaynarayan and Matrosova, Anzhela and Singh, Virendra (2015) A New Scan Flip Flop Design to Eliminate Performance Penalty of Scan. In: 24th IEEE Asian Test Symposium, NOV 22-25, 2015, Mumbai, INDIA, pp. 25-30.

This list was generated on Mon Oct 14 12:25:45 2019 IST.