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Number of items: 3.

Conference Paper

Singh, MP and Raghavan, G and Tyagi, AK and Shivashankar, SA (2001) Ellipsometry as a sensitive technique to probe film -substrate interfaces: $Al_2O_3$ on Si(100). In: Structure-Property Relationships of Oxide Surfaces and Interfaces. Symposium, 27-29 Nov. 2000, Boston, MA, USA, AA3.33.1-AA3.33.6.

Journal Article

Singh, MP and Raghavan, G and Tyagi, AK and Shivashankar, SA (2002) Carbonaceous alumina films deposited by MOCVD from aluminium acetylacetonate: a spectroscopic ellipsometry study. In: Bulletin of Materials Science, 25 (2). pp. 163-168.

Sing, MP and Raghavan, G and Tyagi, AK and Shivashankar, SA (2000) Ellipsometry as a Sensitive Technique to Probe film -Substrate Interfaces: Al2O3 on Si(100). In: MRS Proceedings, 654 .

This list was generated on Thu Sep 19 22:17:43 2019 IST.