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Subramanyan, Pramod and Jangir, Ram Rakesh and Tudu, Jaynarayan and Erik, Larsson and Singh, Virendra (2009) Generation of Minimum Leakage Input Vectors with Constrained NBTI Degradation. In: IEEE East-West Design and Test Symposium (EWDTS) 2009, Moscow, Russia.
Tudu, Jaynarayan and Larsson, Erik and Singh, Virendra and Agrawal, Vishwani D (2009) On Minimization of Peak Power during SoC Test. In: IEEE European Test Symposium (ETS) , May 2009.
Tudu, Jaynarayan and Larsson, Erik and Singh, Virendra and Singh, Adit (2009) Capture Power Reduction for Modular System-on-Chip Test. In: 14th IEEE VLSI Design and Test Symposium (VDAT), Bangalore.
