ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Browse by Author

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 1.

Conference Paper

Tudu, Jaynarayan T and Larsson, Erik and Singh, Virendra and Agrawal, Vishwani D (2009) On Minimization of Peak Power for Scan Circuit during Test. In: 14th IEEE European Test Symposium (EST 2009), May 25-29, 2009, Seville, SPAIN, pp. 25-30.

This list was generated on Wed Oct 23 03:10:25 2019 IST.