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Journal Article

Varaprasad, BKSVL and Patnaik, LM and Jamadagni, HS and Agrawal, VK (2007) A New ATPG Technique (ExpoTan) for Testing Analog Circuits. In: IEEE Transactions on Computer- Aided Design of Integrated Circuits and Designs, 26 (1). pp. 189-196.

Patnaik, LM and Jamadagni, HS and Agrawal, VK and Varaprasad, BKSVL (2002) The state of VLSI testing. In: IEEE Potentials, 21 (3). pp. 12-16.

This list was generated on Fri Apr 25 03:50:54 2014 IST.