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Conference Paper

Viraraghavan, Janakiraman and Das, Bishnu Prasad and Amrutur, Bharadwaj (2008) Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization. In: IEEE International Conference on VLSI Design 2008, 4-8 Jan. 2008 , Hyderabad .

This list was generated on Sun Oct 20 20:03:31 2019 IST.